DocumentCode :
830126
Title :
Design and testing of rapid single flux quantum shift registers with magnetically coupled readout gates
Author :
Yuh, P. ; Mukhanov, O.A.
Author_Institution :
HYPRES Inc., Elmsford, NY, USA
Volume :
2
Issue :
4
fYear :
1992
Firstpage :
214
Lastpage :
221
Abstract :
Experimental superconducting shift registers consisting of on-chip clock generators, clock regeneration and distribution circuits, shift register elements, and readout circuits are designed using rapid single flux quantum logic/memory (RSFQ) gates. A 7-b shift register has been tested to 12 GHz and a 17-b to 21 GHz using external triggering clocks with relative delay measurements. Testing with internal clocks generated from Josephson oscillations shows a potential high-speed operation of 45 GHz for the 7-b and 30 GHz for the 17-b shift registers. Two types of magnetically coupled readout gates are discussed. The chips are fabricated using a Nb/AlO/sub /x/Nb Josephson-junction process at a critical-current density of 1000 A/cm/sup 2/. The power dissipation per bit is 3 mu W.<>
Keywords :
shift registers; superconducting logic circuits; 12 GHz; 21 GHz; 3 muW; Josephson oscillations; Nb-AlO/sub x/-Nb junction; RSFQ gates; clock regeneration circuits; design; high-speed operation; magnetically coupled readout gates; on-chip clock generators; power dissipation; rapid single flux quantum shift registers; superconducting shift registers; testing; Circuit testing; Clocks; Delay; Josephson junctions; Logic design; Magnetic flux; Niobium; Semiconductor device measurement; Shift registers; Superconducting logic circuits;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.182733
Filename :
182733
Link To Document :
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