Title :
Extraction and Estimation of Pinned Photodiode Capacitance in CMOS Image Sensors
Author :
Chao, Calvin Yi-Ping ; Yi-Che Chen ; Kuo-Yu Chou ; Jhy-Jyi Sze ; Fu-Lung Hsueh ; Shou-Gwo Wuu
Author_Institution :
Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
Abstract :
The pinned photodiode capacitance extraction method proposed by Goiffon et al. is discussed, and two additional new methods are presented and analyzed; one based on the full well dependence on photon flux and the other based on the full well dependence on transfer-gate off-voltage.
Keywords :
CMOS image sensors; photodetectors; photodiodes; CMOS image sensor; photon flux; pinned photodiode capacitance estimation method; pinned photodiode capacitance extraction method; transfer-gate off-voltage; CMOS image sensors; Capacitance; Educational institutions; Photodiodes; Photonics; Voltage measurement; Active pixel sensors (APS); CMOS image sensors (CIS); full well capacity (FWC); pinned photodiode (PPD); pinning voltage;
Journal_Title :
Electron Devices Society, IEEE Journal of the
DOI :
10.1109/JEDS.2014.2318060
