• DocumentCode
    830365
  • Title

    Interaction of Rectangular Open-Ended Waveguides With Surface Tilted Long Cracks in Metals

  • Author

    Mazlumi, Farhad ; Sadeghi, Seyed H Hesamedin ; Moini, Rouzbeh

  • Author_Institution
    Civil Aviation Technol. Coll., Tehran
  • Volume
    55
  • Issue
    6
  • fYear
    2006
  • Firstpage
    2191
  • Lastpage
    2197
  • Abstract
    This paper presents a modeling technique for output-signal prediction of a waveguide probe when scanning a tilted long crack. The modeling technique establishes a cavity by placing a hypothetical conductive plane within the waveguide at some distance away from the probe-crack mouth. The position of the plane is iteratively changed until the appropriate resonance frequency of the cavity equals the operating frequency. In this case, the plane lies at one of the dominant-mode standing-wave nulls inside the waveguide from which the reflection coefficient, and hence, the probe output signal are determined. The main feature of the model is its ability to solve a three-dimensional problem in a two-dimensional framework, thus reducing the degree of complexity and computation time. Several simulation results are presented to evaluate the accuracy of the model at two operating frequencies in the X and K bands. The results are compared with the experimental results and those obtained using a commercial finite-element code, demonstrating the accuracy of the modeling technique
  • Keywords
    crack detection; microwaves; nondestructive testing; surface cracks; waveguides; 18 to 27 GHz; 8 to 12 GHz; K bands; X band; microwave nondestructive testing; output signal prediction; rectangular open-ended waveguides; tilted long cracks; waveguide probe; Mouth; Planar waveguides; Predictive models; Probes; Rectangular waveguides; Reflection; Resonance; Resonant frequency; Surface cracks; Surface waves; Metal; microwave nondestructive testing (MNDT); tilted crack; waveguide;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2006.884282
  • Filename
    4014719