• DocumentCode
    830752
  • Title

    A novel vertical-cavity surface-emitting laser with semiconductor/superlattice distributed bragg reflectors

  • Author

    Yan-Kuin Su ; Jingchang Zhong ; Shooti-Jinn Chang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    14
  • Issue
    10
  • fYear
    2002
  • Firstpage
    1388
  • Lastpage
    1390
  • Abstract
    Taking into account the tunneling effect of the superlattice, the authors present for the first time a vertical-cavity surface-emitting laser with AlAs[GaAs-AlAs] semiconductor/superlattice distributed Bragg reflectors (DBRs). The structure of a 19-period-AlAs (73.3 nm)-18.5-pair [GaAs (3.0 nm)-AlAs (0.7 nm)] DBR was grown on an n-GaAs [100] substrate by molecular beam epitaxy, and the device was fabricated by using a modified technique of proton implantation. It was found from the experiments that the peak reflectivity of the DBR is as high as 99.7%, the central wavelength is at about 840 nm, and the reflection bandwidth is wide up to 90 nm. A 20×20 μm2 square mesa on the top of the DBR was made by the wet chemical etching method to measure the series resistance of the devices. It can be seen that more than a third of them are within 20-30 /spl Omega/ that lead to ideal optical characteristics, low dissipated power, and reliability-some of the most important factors for the devices to be used in a number of applications in the future.
  • Keywords
    III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; electric resistance; etching; gallium arsenide; ion implantation; laser reliability; molecular beam epitaxial growth; optical fabrication; reflectivity; semiconductor growth; semiconductor superlattices; surface emitting lasers; tunnelling; 0.7 nm; 19-period; 20 micron; 20 to 30 ohm; 3.0 nm; 73.3 nm; 840 nm; AlAs-GaAs-AlAs; AlAs[GaAs-AlAs] semiconductor/superlattice distributed Bragg reflectors; GaAs; central wavelength; ideal optical characteristics; low dissipated power; molecular beam epitaxy; n-GaAs [100] substrate; peak reflectivity; proton implantation; reflection bandwidth; reliability; semiconductor/superlattice distributed Bragg reflectors; series resistance; square mesa; tunneling effect; vertical-cavity surface-emitting laser; wet chemical etching; Distributed Bragg reflectors; Gallium arsenide; Molecular beam epitaxial growth; Optical surface waves; Semiconductor lasers; Semiconductor superlattices; Substrates; Surface emitting lasers; Tunneling; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2002.801086
  • Filename
    1037526