• DocumentCode
    83081
  • Title

    A Single and Adjacent Symbol Error-Correcting Parallel Decoder for Reed–Solomon Codes

  • Author

    Namba, Kazuteru ; Lombardi, Fabrizio

  • Author_Institution
    Grad. Sch. of Adv. Integration Sci., Chiba Univ., Chiba, Japan
  • Volume
    15
  • Issue
    1
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    75
  • Lastpage
    81
  • Abstract
    This paper presents a novel high-speed Reed-Solomon (RS) decoder. The proposed decoder corrects in parallel adjacent and single-symbol errors; moreover, it serially corrects multiple-symbol errors other than adjacent errors. Its operation is based on a novel scheme that extends an existing binary BCH decoder such that a nonbinary RS code can be targeted. The proposed scheme, however, differs from previous schemes in the algorithm and construction of the parallel decoder; the proposed decoder is efficient for multilevel memory systems such as those utilizing phase change memory devices. Simulation results show that the proposed scheme requires a significantly smaller area and lower power than a traditional fully parallelized RS decoder capable of correcting any double-symbol errors in parallel. Furthermore, it is also shown that it requires a smaller area than a parallel error correction scheme using a nonbinary double-error-correcting orthogonal Latin square code.
  • Keywords
    BCH codes; Reed-Solomon codes; binary codes; decoding; error correction codes; orthogonal codes; phase change memories; Bose-Chaudhuri-Hocquenghem code; RS decoder; Reed-Solomon code; adjacent symbol error correction parallel decoder; binary BCH decoder; multilevel memory system; nonbinary double-error correcting orthogonal Latin square code; phase change memory device; Calculators; Decoding; Error correction; Error correction codes; Generators; Phase change materials; Resistance; Error correcting code (ECC); Reed-Solomon (RS) codes; Reed???Solomon (RS) codes; adjacent error correction (AEC); parallel decoder;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2014.2379513
  • Filename
    6979260