DocumentCode
831232
Title
SPaRe: selective partial replication for concurrent fault-detection in FSMs
Author
Drineas, Petros ; Makris, Yiorgos
Author_Institution
Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
Volume
52
Issue
6
fYear
2003
Firstpage
1729
Lastpage
1737
Abstract
We discuss SPaRe: selective partial replication, a methodology for concurrent fault detection in finite state machine (FSMs). The proposed method is similar to duplication, wherein a replica of the circuit acts as a predictor that immediately detects errors by comparison to the original FSM. However, instead of duplicating the FSM, SPaRe selects a few prediction functions which only partially replicate it. Selection is guided by the objective of minimizing the incurred hardware overhead without compromising the ability to detect all faults, yet possibly introducing fault-detection latency. SPaRe is nonintrusive and does not interfere with the encoding and implementation of the original FSM. Experimental results indicate that SPaRe achieves significant hardware overhead reduction over both duplication and test vector logic replication (TVLR), a previously reported concurrent fault-detection method. Moreover, as compared to TVLR, SPaRe also reduces the average fault-detection latency for detecting all permanent faults.
Keywords
automatic test pattern generation; built-in self test; fault diagnosis; fault tolerance; finite state machines; concurrent fault detection; concurrent self-test; fault-detection latency; finite state machine; incurred hardware overhead; prediction functions; selective partial replication; test vector logic replication; Automata; Circuit faults; Circuit testing; Costs; Degradation; Delay; Electrical fault detection; Fault detection; Hardware; Logic testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2003.818733
Filename
1246543
Link To Document