Title :
Hardening Frequency Standards for Space Applications
Author :
Flanagan, T.M. ; Palkuti, L.J. ; Leadon, R.E. ; Bloom, G.E.
Author_Institution :
Frequency & Time Systems, Inc., Danvers, MA
Keywords :
Atomic clocks; Circuits; Flowcharts; Frequency; Measurement standards; Predictive models; Radiation hardening; Resonance; Testing; Voltage-controlled oscillators;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4329202
