• DocumentCode
    831701
  • Title

    An Evaluation of IC EMP Failure Statistics

  • Author

    Jenkins, R. ; Durgin, David L.

  • Volume
    24
  • Issue
    6
  • fYear
    1977
  • Firstpage
    2361
  • Lastpage
    2364
  • Abstract
    This paper presents the results of an integrated circuit test program to determine the statistics associated with open circuit IC failure voltages. Histograms of open circuit voltage for seven IC types are presented. Comparisons are made between measured and predicted data based on the Jenkins-Durgin model. Goodness of fit tests have been run for several distributions including normal, log normal, Weibull, and exponential. The results of these tests showed no consistantly good fit to any of the distributions.
  • Keywords
    Circuit testing; EMP radiation effects; Histograms; Integrated circuit measurements; Integrated circuit testing; Predictive models; Statistical analysis; Statistical distributions; Statistics; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1977.4329222
  • Filename
    4329222
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=831701