DocumentCode
832686
Title
Very wideband operation of twin-layer inset dielectric guide
Author
Pennock, Steve R. ; Izzat, Narian ; Rozzi, Tullio
Author_Institution
Sch. of Electron. & Electr. Eng., Bath Univ., UK
Volume
40
Issue
10
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
1910
Lastpage
1917
Abstract
An inset dielectric guide (IDG) with a multilayer dielectric filling is studied, using the transverse resonance diffraction, technique. The convergence and numeric efficiency of the analysis are good, and comparisons with experimental measurements of phase constant show the validity of the data produced. Those aspects of the IDG structure that limit its monomode bandwidth when it is filled with a single dielectric are investigated. It is shown how the monomode bandwidth of such an IDG may be made greater than that of rectangular metal waveguide by appropriate choice of aspect ratio. It is also shown how the simple use of two dielectric layers in the IDG slot can yield a guide whose monomode bandwidth is 66%, which is much greater than the typical operating bandwidth of a standard double ridge waveguide (40%). In the maximum bandwidth configuration, variation in the position of the boundary between the dielectrics produces little change in bandwidth. Hence, it appears that multilayer IDG is an attractive transmission media for wideband applications at both microwave and millimeter-wave frequencies
Keywords
dielectric-loaded waveguides; waveguide theory; IDG structure; aspect ratio; convergence; inset dielectric guide; maximum bandwidth configuration; microwave frequencies; millimeter-wave frequencies; monomode bandwidth; multilayer dielectric filling; numeric efficiency; phase constant; transverse resonance diffraction; twin-layer; wideband operation; Bandwidth; Convergence of numerical methods; Dielectric measurements; Diffraction; Filling; Nonhomogeneous media; Phase measurement; Rectangular waveguides; Resonance; Wideband;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.159628
Filename
159628
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