• DocumentCode
    832764
  • Title

    Characterizing microwave planar circuits using the coupled finite-boundary element method

  • Author

    Wu, Kun-Lung ; Litva, J.

  • Author_Institution
    Commun. Res. Lab., McMaster Univ., Hamilton, Ont.
  • Volume
    40
  • Issue
    10
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    1963
  • Lastpage
    1966
  • Abstract
    A general approach is presented for the analysis of microwave planar circuits. The technique is particularly well suited to the analysis of circuits with complicated geometries and dielectric loads. The technique is a hybrid, consisting of an amalgamation of the finite-element and boundary-element techniques. It can handle problems with mixed electric and magnetic walls, as well as complicated dielectric loads, such as those composed of ferrite materials. Computed and measured data for various complicated devices are compared, showing excellent agreement
  • Keywords
    boundary-elements methods; finite element analysis; microstrip components; microwave circuits; strip line components; BEM; FEA; FEM; coupled finite-boundary element method; dielectric loads; ferrite materials; microwave planar circuits; mixed electric/magnetic walls; Circuit analysis; Coupling circuits; Dielectric materials; Dielectric measurements; Ferrites; Finite element methods; Geometry; Magnetic analysis; Magnetic materials; Microwave circuits;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.159635
  • Filename
    159635