DocumentCode
833208
Title
Observation and Modeling of a Room-Temperature Negative Characteristic Temperature 1.3-
m p-Type Modulation-Doped Quantum-Dot Laser
Author
Jin, Chao-Yuan ; Badcock, Tom J. ; Liu, Hui-Yun ; Groom, Kristian M. ; Royce, Richard J. ; Mowbray, David J. ; Hopkinson, Mark
Author_Institution
Dept. of Electron. & Electr. Eng., Univ. of Sheffield
Volume
42
Issue
12
fYear
2006
Firstpage
1259
Lastpage
1265
Abstract
A room-temperature negative characteristic temperature (T0 ) and ultralow threshold current density (Jth) of 48 Amiddotcm-2 are demonstrated for a 1.3-mum InAs quantum dot laser. These characteristics are obtained by combining a high-growth-temperature GaAs spacer layer with p-type modulation doping of the quantum dots in multiple layer dot-in-a-well structures. Through a comparison of p-doped and undoped devices, a photon coupling mechanism is proposed to account for the different temperature dependences of Jth for the two devices. Numerical simulations based on a rate equation model, which includes photon coupling between ground and excited quantum dot states, are performed. The simulations are able to account for the very different temperature-dependent Jth behavior of the doped and undoped device
Keywords
III-V semiconductors; current density; excited states; ground states; indium compounds; optical modulation; quantum dot lasers; semiconductor doping; 1.3 mum; 293 to 298 K; InAs; InAs quantum-dot laser; excited quantum dot states; ground quantum dot states; multiple layer dot-in-a-well structure; negative characteristic temperature; p-type modulation doping; photon coupling; threshold current density; Epitaxial layers; Equations; Gallium arsenide; Land surface temperature; Numerical simulation; Quantum dot lasers; Quantum dots; Semiconductor process modeling; Temperature dependence; Threshold current; ${hbox {p}}$ -type modulation doping; Characteristic temperature $(T_{0})$ ; quantum-dot (QD) laser; threshold current density;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2006.883473
Filename
4015585
Link To Document