Performance of flash ADCs in the 100 MHz range. II. Results from 8 bit devices

Author

Crawley, H.B. ; McKay, R. ; Meyer, W.T. ; Rosenberg, E.I. ; Thomas, W.D.

Author_Institution

Dept. of Phys., Iowa State Univ., Ames, IA, USA

Volume

39

Issue

4

fYear

1992

fDate

8/1/1992 12:00:00 AM

Firstpage

780

Lastpage

783

Abstract

For pt.I see ibid., vol.38, p.102 (1991). Using a test bench that was previously described, the authors have performed tests on 8-b flash analog-to-digital converters (ADCs). For each device they have measured parameters such as linearity, number of effective bits, noise level, aperture jitter, integral and differential nonlinearity, analog bandwidth, and total harmonic distortion. The tests were characterized according to input signal. The tests consisted of sampling the input waveform by taking an event record of up to 2048 consecutive digitizations and then applying the appropriate analysis to this event record. The test results are given

Keywords

analogue-digital conversion; electronic equipment testing; nuclear electronics; 100 MHz; 8 bit devices; ADC; analog bandwidth; aperture jitter; consecutive digitizations; differential nonlinearity; effective bits; event record; flash analog-to-digital converters; input waveform; linearity; noise level; test bench; total harmonic distortion; Analog-digital conversion; Apertures; Bandwidth; Distortion measurement; Jitter; Linearity; Noise level; Noise measurement; Performance evaluation; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.159706

Filename

159706