Title :
An efficient DIPIE algorithm for CAD of electrostatically actuated MEMS devices
Author :
Bochobza-Degani, Ofir ; Elata, David ; Nemirovsky, Yael
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fDate :
10/1/2002 12:00:00 AM
Abstract :
Pull-in parameters are important properties of electrostatic actuators. Efficient and accurate analysis tools that can capture these parameters for different design geometries, are therefore essential. Current simulation tools approach the pull-in state by iteratively adjusting the voltage applied across the actuator electrodes. The convergence rate of this scheme gradually deteriorates as the pull-in state is approached. Moreover, the convergence is inconsistent and requires many mesh and accuracy refinements to assure reliable predictions. As a result, the design procedure of electrostatically actuated MEMS devices can be time-consuming. In this paper a novel Displacement Iteration Pull-In Extraction (DIPIE) scheme is presented. The DIPIE scheme is shown to converge consistently and far more rapidly than the Voltage Iterations (VI) scheme (>100 times faster!). The DIPIE scheme requires separate mechanical and electrostatic field solvers. Therefore, it can be easily implemented in existing MOEMS CAD packages. Moreover, using the DIPIE scheme, the pull-in parameters extraction can be performed in a fully automated mode, and no user input for search bounds is required.
Keywords :
convergence; electronic design automation; electrostatic actuators; iterative methods; mechanical engineering computing; micro-optics; micromechanical devices; relaxation theory; DIPIE algorithm; MOEMS CAD packages; computer-aided design; convergence rate; design geometries; displacement iteration; displacement iteration pull-in extraction scheme; electrostatic actuators; electrostatic field solver; electrostatically actuated MEMS devices; mechanical field solver; pull-in parameters; Convergence; Design automation; Electrodes; Electrostatic actuators; Geometry; Iterative algorithms; Microelectromechanical devices; Packaging; Parameter extraction; Voltage;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2002.803280