• DocumentCode
    834008
  • Title

    Fabrication of high-quality multilayer structure for HTS-SFQ circuits using surface treatments

  • Author

    Nakayama, Kohei ; Ishimaru, Yoshihiro ; Wakana, Hironori ; Adachi, Seiji ; Tarutani, Yoshinobu ; Tanabe, Keiichi

  • Author_Institution
    Int. Supercond. Technol. Center, Supercond. Res. Lab., Tokyo, Japan
  • Volume
    15
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    157
  • Lastpage
    160
  • Abstract
    Surface treatments have been applied to a multilayer structure in order to improve its surface smoothness and crystallinity for fabricating HTS-SFQ circuits. The surface treatments consist of ion beam etching and annealing in oxygen atmosphere. These surface treatments were applied to a SrSnO3 insulating layer on a La-YBCO grandplane as an underlayer for growth of a La-YBCO base layer. From RHEED observation, it was found that a contamination layer or an amorphous layer formed on the SrSnO3 surface after the bilayer was exposed to oxygen plasma for removing a photoresist film. The SrSnO3 surface structure was observed to be recovered through the ion etching and subsequent annealing procedure. XRD measurement revealed that FWHM of the SrSnO3 [200] rocking curve reduced from that of the as-deposited SrSnO3 after an annealing at 715°C in 120 mTorr oxygen atmosphere, indicating that crystallinity of the SrSnO3 layer was also slightly improved. The recovery process for the SrSnO3 layer significantly improved the surface roughness Ra and the Jc at 4.2 K of the La-YBCO base layer.
  • Keywords
    X-ray diffraction; annealing; barium compounds; high-temperature superconductors; lanthanum compounds; multilayers; sputter etching; strontium compounds; superconducting junction devices; surface roughness; surface treatment; yttrium compounds; 120 mTorr; 4.2 K; 715 C; HTS-SFQ circuits; La-YBCO; RHEED observation; SrSnO3-LaYBa2Cu3O7-x; XRD measurement; amorphous layer; annealing; contamination layer; crystallinity; full width at half maximum; groundplane; high temperature superconductor; insulating layer; ion beam etching; multilayer structure fabrication; surface roughness; surface smoothness; surface treatments; Annealing; Atmosphere; Circuits; Crystallization; Etching; Fabrication; Nonhomogeneous media; Plasma measurements; Surface contamination; Surface treatment; High temperature superconductor; La-YBCO; multilayer; surface treatment;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.849729
  • Filename
    1439600