Modeling and Fast Eye Diagram Estimation of Ringing Effects on Branch Line Structures

Author

Kang-Yun Yang ; Chang-Bao Chang ; Ting-Ying Wu ; Wen-Shan Wang ; Ying-Hsi Lin ; Ruey-Beei Wu

Author_Institution

Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan

Volume

4

Issue

4

fYear

2014

fDate

Apr-14

Firstpage

641

Lastpage

647

Abstract

Significant ringing effects due to multiple reflections are first addressed for the slightly unbalanced address lines in the double data rate memory systems. A resistance-inductance-capacitance resonance model is proposed to explain its occurrence by fitting the transfer function in frequency domain. The transient analysis can then be performed easily and the peak distortion analysis is used to predict its eye height. The cases with the worst signal integrity were identified and a simple design rule is derived to avoid its occurrence, which is dependent on the attenuation constant of the transmission line and the data rate of the signal.

Keywords

RLC circuits; circuit resonance; equivalent circuits; printed circuit design; semiconductor storage; transient analysis; transmission line theory; branch line structures; design rule; double data rate memory system; fast eye diagram estimation; frequency domain; resistance-inductance-capacitance resonance model; ringing effect; signal data rate; slightly unbalanced address lines; transfer function; transient analysis; transmission line; worst signal integrity; Equivalent circuits; Integrated circuit modeling; Layout; Noise; Power transmission lines; Transfer functions; Transient analysis; Address line; branch line; double data rate (DDR); eye diagram; resistance-inductance-capacitance (RLC) resonance; ringing effect; signal integrity;

fLanguage

English

Journal_Title

Components, Packaging and Manufacturing Technology, IEEE Transactions on

Publisher

ieee

ISSN

2156-3950

Type

jour

DOI

10.1109/TCPMT.2013.2297320

Filename

6729033