DocumentCode :
834520
Title :
A Survey of Radiation Hardened Microelectronic Memory Technology
Author :
Vail, Patrick J.
Author_Institution :
Rome Air Development Center Deputy for Electronic Technology Hanscom AFB MA 01731
Volume :
25
Issue :
6
fYear :
1978
Firstpage :
1196
Lastpage :
1204
Abstract :
A study was performed to identify needed research and development in radiation hardened microelectronic memory technology. A review was made of the requirements for memories, the state-of-the-art of mature memory technologies, the trends in the development of unhardened commercial memory technologies, and the current technology gaps facing memory technologies and their prospects for solution. The main conclusion of the study is that the greatest need is for hardened nonvolatile MNOS and Bubble memories, but that these technologies have many difficult technology gaps to overcome. Strategies for research and development on these technologies are given. If this research and development is successful in overcoming these gaps, the positions of MNOS and bubble memories in both the military and commercial market will be greatly enhanced. The advantages of nonvolatility will insure for these technologies the large production base needed to establish confidence in the use of these memory technologies.
Keywords :
Consumer electronics; Costs; Microelectronics; Military computing; Nonvolatile memory; Production; Radiation hardening; Research and development; Solid state circuits; Space technology;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1978.4329513
Filename :
4329513
Link To Document :
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