DocumentCode
835293
Title
Total Dose Tfsting of Several Types of MOS Microprocessors
Author
King, E.E.
Author_Institution
Naval Research Laboratory Washington, D.C. 20375
Volume
25
Issue
6
fYear
1978
Firstpage
1649
Lastpage
1651
Abstract
Three types of microprocessors, the 8008, the 8080A, and the 1802, were tested in an ionizing radiation environment. Failure levels ranged from a very low 700 rads(Si) to anproximately 7000 rads(Si). With proper choice of vendor and lot screening it may be possible to meet some system requirements with off-the-shelf parts.
Keywords
CMOS technology; Clocks; Ionizing radiation; Large scale integration; Manufacturing processes; Microprocessors; Performance evaluation; Production; Stress; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1978.4329588
Filename
4329588
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