• DocumentCode
    838997
  • Title

    Optical Path Length Factor at Near-Bandgap Wavelengths in Si Solar Cells

  • Author

    Abenante, Luigi

  • Author_Institution
    ENEA-ENE FORI, Rome
  • Volume
    53
  • Issue
    12
  • fYear
    2006
  • Firstpage
    3047
  • Lastpage
    3053
  • Abstract
    By using the Rand and Basore (R&B) physical model for light trapping, a particular analytical expression for near-bandgap optical path length factor Zo is derived for the case where back surface reflectivity RBACK is equal to unity (RBACK = 1). This expression shows that according to the R&B physical model, at RBACK = 1, Zo has a finite value. At RBACK = 1, the R&B expression for Zo is shown to diverge. By using the original R&B derivation procedure, a new expression for Zo is obtained, which at RBACK = 1, reduces to the aforementioned particular expression for ideal back surface reflectance. The new expression is immune from the physical incongruity and tendency to overestimate Zo that affect the R&B expression. By using the new expression, a relationship between Zo and the Yablonovitch and Cody (Y&C) absorption-enhancement factor is derived for devices where parasitic absorption predominantly occurs at backside reflector. This relationship is shown to be in agreement with the literature. In the derivation, a connection between the approaches to light trapping of R&B and Y&C is exploited. This connection allows obtaining a new method to evaluate RBACK at near-bandgap wavelengths in most Si solar cells. The new method is checked on two real Si solar cells and found to provide plausible results. Compared to the method used by R&B, the method presented in this paper is shown to be more reliable
  • Keywords
    elemental semiconductors; energy gap; reflectivity; silicon; solar cells; Rand and Basore physical model; Si; Yablonovitch and Cody absorption-enhancement factor; back surface reflectance; back surface reflectivity; device modeling; light trapping; near-bandgap optical path length factor; near-bandgap wavelengths; parasitic absorption; solar cells; Absorption; Charge carrier processes; Optical reflection; Optical refraction; Optical surface waves; Photovoltaic cells; Random media; Reflectivity; Silicon; Surface waves; Device modeling; light trapping; optical properties of silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.885518
  • Filename
    4016324