Title :
Distributed network platform for automatic optical inspection
Author :
Moreira, L.F.E. ; Silvino, J.L. ; de Melo, J.C.D. ; Coelho, C.N., Jr.
Author_Institution :
Electr. Eng. R&D Center, Fed. Univ. of Minas Gerais, Belo Horizonte-MG, Brazil
Abstract :
Network bandwidth is a bottleneck for multipoint industrial automatic optical inspection. To avoid this constraint, a platform that integrates image acquisition and processing power to allow local processing is proposed. The reduction of network bandwidth requirements is discussed. The performance and feasibility is briefly discussed through preliminary experimental results.
Keywords :
CMOS image sensors; automatic optical inspection; computer vision; embedded systems; field programmable gate arrays; intelligent sensors; reconfigurable architectures; CMOS image sensors; FPGA; RAMDAC; automatic optical inspection; configuration controller; costs per inspection point; distributed network platform; embedded execution; fully distributed inspection; image acquisition; image processing power; inspection algorithms; intelligent camera; interface logic; local processing; machine vision; multipoint industrial inspection; network bandwidth; quality control; reconfiguration capabilities; software interface;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20031120
