DocumentCode
839422
Title
Single-Period InAs–GaAs Quantum-Dot Infrared Photodetectors
Author
Chou, Shu-Ting ; Lin, Shih-Yen ; Tseng, Chi-Che ; Chen, Yi-Hao ; Chen, Cheng-Nan ; Wu, Meng-Chyi
Author_Institution
Res. Center for Appl. Sci., Acad. Sinica, Taipei
Volume
20
Issue
18
fYear
2008
Firstpage
1575
Lastpage
1577
Abstract
In this letter, we investigate the performance of single-period InAs-GaAs quantum-dot (QD) infrared photodetectors, in which the single-period QD is sandwiched by different thicknesses of the undoped GaAs confinement layers. By using a 5-nm p-type GaAs layer as a current blocking barrier, the investigated three devices exhibit no response, the highest response, and the medium response, respectively. It is attributed to three different electron occupancy situations in the QD region resulted from the various locations of the Fermi level. A higher barrier for the thermionic emission current is observed for the device with a lower Fermi level in the QD structure. It is attributed to the acceptor-like behavior of the depleted QD such that a higher barrier height would be observed.
Keywords
Fermi level; III-V semiconductors; gallium compounds; indium compounds; infrared detectors; photodetectors; semiconductor quantum dots; thermionic emission; Fermi level; GaAs confinement layers; InAs-GaAs; InAs-GaAs quantum-dot infrared photodetectors; current blocking barrier; electron occupancy situations; size 5 nm; thermionic emission current; Capacitive sensors; Electromagnetic wave absorption; Electrons; Fabrication; Gallium arsenide; Molecular beam epitaxial growth; Photodetectors; Quantum dots; Quantum well devices; Thermionic emission; Quantum dot (QD); quantum-dot infrared photodetector (QDIP);
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2008.928847
Filename
4603044
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