Title :
High quantum efficiency, long wavelength InP/InGaAs microcavity photodiode
Author :
Dentai, A.G. ; Kuchibhotla, R. ; Campbell, Joe C. ; Tsai, Chia-Yin ; Lei, Changhui
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Abstract :
There is a inherent tradeoff between the quantum efficiency and bandwidth of conventional PIN photodiodes. In the case of devices based on III-V semiconductors, an absorption region thickness of approximately 2 mu m is required to achieve quantum efficiencies greater than 80%, although this limits the transit-time-limited bandwidth to less than 15 GHz. It has recently been shown that a microcavity photodiode can circumvent this performance tradeoff and achieve both high quantum efficiency and large bandwidths. The fabrication of a microcavity PIN photodiode with a high quantum efficiency near 1.55 mu m is described. An external quantum efficiency of 82% at 1480 nm has been achieved with an InGaAs absorption layer only 2000 AA thick embedded in a resonant cavity grown by metal organic vapor phase epitaxy (MOVPE).
Keywords :
III-V semiconductors; cavity resonators; gallium arsenide; indium compounds; p-i-n diodes; photodiodes; 1.55 micron; 1480 nm; 82 percent; III-V semiconductors; InGaAs absorption layer; InP-InGaAs; MOVPE; PIN photodiode; bandwidth; fabrication; long wavelength; metal organic vapor phase epitaxy; microcavity photodiode; performance tradeoff; quantum efficiency; resonant cavity;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19911316