DocumentCode
8396
Title
Timing Uncertainty in 3-D Clock Trees Due to Process Variations and Power Supply Noise
Author
Hu Xu ; Pavlidis, Vasilis F. ; Xifan Tang ; Burleson, Wayne ; De Micheli, G.
Author_Institution
Integrated Syst. Lab., EPFL, Lausanne, Switzerland
Volume
21
Issue
12
fYear
2013
fDate
Dec. 2013
Firstpage
2226
Lastpage
2239
Abstract
Clock distribution networks are affected by different sources of variations. The resulting clock uncertainty significantly affects the frequency of a circuit. To support this analysis, a statistical model of skitter, which consists of clock skew and jitter, for 3-D clock trees is introduced. The effect of skitter on both the setup and hold time slacks is modeled. The variation of skitter is shown to be underestimated up to 36% if process variations and dynamic power supply noise are considered separately, which highlights the importance of this unified treatment. Potential scenarios of supply noise in 3-D integrated circuits (ICs) are investigated. 3-D circuits generated from industrial benchmarks are simulated to show the skitter under these scenarios. The mean and standard deviation of skitter can vary up to 60% and 51%, respectively, due to the different amplitudes and phases of supply noise. The tradeoff between skitter and the power consumed by clock trees is also shown. A set of guidelines are presented to decrease skitter in 3-D ICs. By applying these guidelines to industrial benchmarks, simulations show a decrease in the mean skitter up to 31%.
Keywords
clock distribution networks; clocks; jitter; power supply circuits; three-dimensional integrated circuits; timing; 3D IC; 3D clock trees; 3D integrated circuits; clock distribution networks; clock skew; clock uncertainty; dynamic power supply noise; hold time slacks; industrial benchmarks; jitter; process variations; skitter; statistical model; timing uncertainty; Clocks; Delay; Integrated circuit modeling; Jitter; Noise; Power supplies; Uncertainty; 3-D ICs; clock jitter; clock skew; clock tree; power supply noise; process variations; skitter;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2012.2230035
Filename
6410052
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