• DocumentCode
    8396
  • Title

    Timing Uncertainty in 3-D Clock Trees Due to Process Variations and Power Supply Noise

  • Author

    Hu Xu ; Pavlidis, Vasilis F. ; Xifan Tang ; Burleson, Wayne ; De Micheli, G.

  • Author_Institution
    Integrated Syst. Lab., EPFL, Lausanne, Switzerland
  • Volume
    21
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    2226
  • Lastpage
    2239
  • Abstract
    Clock distribution networks are affected by different sources of variations. The resulting clock uncertainty significantly affects the frequency of a circuit. To support this analysis, a statistical model of skitter, which consists of clock skew and jitter, for 3-D clock trees is introduced. The effect of skitter on both the setup and hold time slacks is modeled. The variation of skitter is shown to be underestimated up to 36% if process variations and dynamic power supply noise are considered separately, which highlights the importance of this unified treatment. Potential scenarios of supply noise in 3-D integrated circuits (ICs) are investigated. 3-D circuits generated from industrial benchmarks are simulated to show the skitter under these scenarios. The mean and standard deviation of skitter can vary up to 60% and 51%, respectively, due to the different amplitudes and phases of supply noise. The tradeoff between skitter and the power consumed by clock trees is also shown. A set of guidelines are presented to decrease skitter in 3-D ICs. By applying these guidelines to industrial benchmarks, simulations show a decrease in the mean skitter up to 31%.
  • Keywords
    clock distribution networks; clocks; jitter; power supply circuits; three-dimensional integrated circuits; timing; 3D IC; 3D clock trees; 3D integrated circuits; clock distribution networks; clock skew; clock uncertainty; dynamic power supply noise; hold time slacks; industrial benchmarks; jitter; process variations; skitter; statistical model; timing uncertainty; Clocks; Delay; Integrated circuit modeling; Jitter; Noise; Power supplies; Uncertainty; 3-D ICs; clock jitter; clock skew; clock tree; power supply noise; process variations; skitter;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2012.2230035
  • Filename
    6410052