DocumentCode :
8396
Title :
Timing Uncertainty in 3-D Clock Trees Due to Process Variations and Power Supply Noise
Author :
Hu Xu ; Pavlidis, Vasilis F. ; Xifan Tang ; Burleson, Wayne ; De Micheli, G.
Author_Institution :
Integrated Syst. Lab., EPFL, Lausanne, Switzerland
Volume :
21
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
2226
Lastpage :
2239
Abstract :
Clock distribution networks are affected by different sources of variations. The resulting clock uncertainty significantly affects the frequency of a circuit. To support this analysis, a statistical model of skitter, which consists of clock skew and jitter, for 3-D clock trees is introduced. The effect of skitter on both the setup and hold time slacks is modeled. The variation of skitter is shown to be underestimated up to 36% if process variations and dynamic power supply noise are considered separately, which highlights the importance of this unified treatment. Potential scenarios of supply noise in 3-D integrated circuits (ICs) are investigated. 3-D circuits generated from industrial benchmarks are simulated to show the skitter under these scenarios. The mean and standard deviation of skitter can vary up to 60% and 51%, respectively, due to the different amplitudes and phases of supply noise. The tradeoff between skitter and the power consumed by clock trees is also shown. A set of guidelines are presented to decrease skitter in 3-D ICs. By applying these guidelines to industrial benchmarks, simulations show a decrease in the mean skitter up to 31%.
Keywords :
clock distribution networks; clocks; jitter; power supply circuits; three-dimensional integrated circuits; timing; 3D IC; 3D clock trees; 3D integrated circuits; clock distribution networks; clock skew; clock uncertainty; dynamic power supply noise; hold time slacks; industrial benchmarks; jitter; process variations; skitter; statistical model; timing uncertainty; Clocks; Delay; Integrated circuit modeling; Jitter; Noise; Power supplies; Uncertainty; 3-D ICs; clock jitter; clock skew; clock tree; power supply noise; process variations; skitter;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2012.2230035
Filename :
6410052
Link To Document :
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