Title :
Performance analysis of a 0.3-Tb/in2 low-power MFM-based scanning-probe device
Author :
El-Sayed, Rany Tawfik ; Carley, L. Richard
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
In this paper, we present an analysis of the performance of a 0.3-Tb/in2 ultralow-power magnetic-force-microscopy-based scanning-probe storage device actuated by microelectromechanical systems technology. The device is currently under development at Carnegie Mellon University, Pittsburgh, PA. The analysis shows that, with an optimized commercial single-layered Co-based perpendicular medium with an optimized tip trajectory, a signal-to-noise ratio of 20-25 dB is achievable. The analysis includes general design considerations as well as various aspects of performance such as recording dynamics, PW50, intersymbol-interference limit, detection sensitivity, thermal degradation, intertrack interference, off-track errors, process variations, and surface fluctuation effect. Design/performance standards for the new device are suggested.
Keywords :
Monte Carlo methods; PD control; electrostatic actuators; feedback; intersymbol interference; magnetic force microscopy; magnetic heads; magnetic hysteresis; micromagnetics; perpendicular magnetic recording; position control; thermal stability; CMOS MEMS process; MEMS actuated; MFM-based scanning-probe device; Monte Carlo simulation; closed-loop control system; decoupled-mode microstage; design considerations; detection sensitivity; electrostatic parallel-plate actuator; feedback loop; hard magnet single-pole heads; hysteresis loops; intersymbol-interference limit; intertrack interference; micromagnetic simulations; off-track errors; optimized tip trajectory; optimum design; performance analysis; probe-tip position control; process variations; proportional-derivative controller; recording dynamics; sensitivity curve; single-layered perpendicular medium; surface fluctuation effect; thermal degradation; thermal stability; ultralow-power storage device; Fluctuations; Intersymbol interference; Magnetic analysis; Magnetic devices; Microelectromechanical systems; Performance analysis; Perpendicular magnetic recording; Signal analysis; Signal to noise ratio; Thermal degradation;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2003.819457
