• DocumentCode
    840780
  • Title

    A Dual Workfunction Gate for Thin-Gate-Insulator Schottky-Barrier MOSFETs

  • Author

    Shih, Chun-Hsing ; Yeh, Sheng-Pin

  • Author_Institution
    Dept. of Electr. Eng., Yuan Ze Univ., Taoyuan
  • Volume
    55
  • Issue
    9
  • fYear
    2008
  • Firstpage
    2521
  • Lastpage
    2525
  • Abstract
    A dual workfunction gate (DWG) is proposed for the thin-gate-insulator Schottky-barrier MOSFETs (SBMOS) to adjust the barrier distributions by self-aligned tilt-angle implantation. Effects of DWG on SBMOS are investigated using 2-D simulations. Against junction engineering by dopant segregation, as the gate insulator scaled, the stronger gate coupling from DWG can both improve the on-state barrier lowering for electron and enhance the off-state barrier widening for hole. By using DWG architecture, SBMOS can be successfully scaled with thinner gate insulator as the promising candidate for next-generation CMOS devices.
  • Keywords
    MOSFET; Schottky barriers; Schottky gate field effect transistors; work function; dual workfunction gate; self-aligned tilt-angle implantation; thin-gate-insulator Schottky-barrier MOSFET; CMOS technology; Charge carrier processes; Contact resistance; Insulation; Leakage current; MOSFETs; Numerical simulation; Power engineering and energy; Silicidation; Tunneling; Dopant segregation; Schottky-barrier MOSFETs (SBMOS); dual workfunction gate (DWG); thin gate insulator;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.927661
  • Filename
    4603182