• DocumentCode
    840943
  • Title

    High-temperature CW operation of planar buried-ridge structure lasers at λ=1.5 μm

  • Author

    Thulke, W. ; Zach, A.

  • Author_Institution
    Siemens AG Res. Labs., Muchen, West Germany
  • Volume
    24
  • Issue
    16
  • fYear
    1988
  • fDate
    8/4/1988 12:00:00 AM
  • Firstpage
    992
  • Lastpage
    993
  • Abstract
    GaInAsP/InP-PBRS lasers emitting at 1.5 μm have been fabricated by multiple liquid-phase epitaxy. Effective current confinement is achieved without current blocking layers. CW threshold current is as low as 9 mA at 25°C. Output powers per facet of up to 10 mW at 80°C and 3.5 mW at 100°C are obtained. The maximum operation temperature of 110°C is the highest value yet achieved with this type of laser at 1°5 μm
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; optical communication equipment; semiconductor junction lasers; vapour phase epitaxial growth; 1.5 micron; 10 mW; 110 C; 25 C; 9 mA; CW operation; CW threshold current; GaInAsP-InP; high temperature operation; planar buried-ridge structure lasers;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • Filename
    191687