Optimum simple ramp-tests for the Weibull distribution and type-I censoring

Author

Bai, D.S. ; Cha, M.S. ; Chung, S.W.

Author_Institution

Dept. of Ind. Eng., Korea Adv. Inst. of Sci. & Technol., Daejon, South Korea

Volume

41

Issue

3

fYear

1992

fDate

9/1/1992 12:00:00 AM

Firstpage

407

Lastpage

413

Abstract

An optimum simple ramp test-accelerated life test with two different linearly increasing stresses-is presented for the Weibull distribution under type I censoring. It is assumed that the inverse power law holds between the Weibull scale parameter and the constant stress and that the cumulative exposure model for the effect of changing stress applies. The optimum plan-low stress rate and proportion of test units allocated to low stress mode-is found. It minimizes the asymptotic variance of the maximum likelihood estimator of a stated quantile at design stress. For selected values of the design parameters, these optimum plans are tabulated, and the effect of the preestimates of these parameters are studied

Keywords

life testing; maximum likelihood estimation; parameter estimation; reliability theory; MLE; Weibull distribution; accelerated life test; asymptotic variance; cumulative exposure model; inverse power law; lifetime distribution; linearly increasing stresses; low stress rate; maximum likelihood estimator; optimum simple ramp test; reliability; sensitivity analysis; Circuit testing; Life estimation; Life testing; Lifetime estimation; Maximum likelihood estimation; Senior members; State estimation; Statistical analysis; Stress; Weibull distribution;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.159808

Filename

159808