Title :
Generalized electron beam matching in the free-electron laser
Author :
Elliott, C. James
Author_Institution :
Los Alamos Nat. Lab., NM, USA
fDate :
12/1/1991 12:00:00 AM
Abstract :
Three matching schemes are presented for Gaussian profile electron beams in free-electron lasers (FELs). The three different classes of matching or symmetry conditions are (1) electron beams with separate betatron matching in each plane, (2) those with aspect ratio matching, and (3) cross-matched beams. The new schemes are distinct generalizations of well-known betatron matching and include ribbon profiles. The corresponding effective energy distributions and their Fourier transforms are obtained in analytical form. An analytical kernel produces the key Fredholm integral equation that solves the initial value problem
Keywords :
Fourier transforms; betatrons; electron beams; free electron lasers; initial value problems; integral equations; laser theory; FEL; Fourier transforms; Fredholm integral equation; Gaussian profile electron beams; analytical form; aspect ratio matching; cross-matched beams; effective energy distributions; free-electron laser; generalised electron beam matching; initial value problem; ribbon profiles; separate betatron matching; symmetry conditions; Algorithm design and analysis; Electron beams; Fourier transforms; Free electron lasers; Gaussian processes; Integral equations; Kernel; Laser modes; Laser theory; Optical modulation;
Journal_Title :
Quantum Electronics, IEEE Journal of
