Title :
A Multicycle Test Set Based on a Two-Cycle Test Set With Constant Primary Input Vectors
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Test compaction can be achieved by using multicycle tests. To avoid the computationally intensive process of sequential test generation, multicycle tests can be generated by extending two-cycle tests. However, the scan-in state of a two-cycle test is not always effective for a multicycle test when the primary input vectors are held constant during the functional clock cycles of a test. This paper studies the extent of this issue by considering exhaustive two-cycle and multicycle test sets with constant primary input vectors for finite-state machine benchmarks. Based on the results of this study, it describes an efficient test compaction procedure that modifies selected two-cycle tests in a given test set in order to make them more effective as a source for multicycle tests with constant primary input vectors. Experimental results are presented to demonstrate the importance of this step to test compaction.
Keywords :
circuit testing; finite state machines; constant primary input vector; finite-state machine; functional clock cycle; multicycle test set; sequential test generation; test compaction procedure; two-cycle test set; Benchmark testing; Circuit faults; Clocks; Compaction; Delays; Niobium; Vectors; Broadside tests; multi-cycle tests; multicycle tests; test compaction; test generation; transition faults;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2015.2408257