Title :
Critical current degradation in HTS wires due to cyclic mechanical strain
Author :
Ryan, David T. ; Li, Liang ; Huang, Xianrui ; Bray, J.W. ; Laskaris, Evangelos T. ; Sivasubramaniam, Kiruba ; Gadre, Aniruddha D. ; Fogarty, James M. ; Harley, E.J. ; Otto, A. ; den Ouden, A.
Author_Institution :
Gen. Electr. Global Res. Center, Niskayuna, NY, USA
fDate :
6/1/2005 12:00:00 AM
Abstract :
HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5% and cycle numbers up to and beyond 104.
Keywords :
bismuth compounds; calcium compounds; critical currents; high-temperature superconductors; stress effects; strontium compounds; BiSrCaCuO; HTS wires; centripetal force; critical current degradation; cyclic mechanical strain; electric devices; electromagnetic force; tensile strain; thermal force; Capacitive sensors; Critical current; High temperature superconductors; Magnetic field induced strain; Magnets; Rotating machines; Strain measurement; Tensile strain; Thermal degradation; Wires; Critical current degradation; HTS wires; cyclic strains; electric devices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849392
