Critical current degradation in HTS wires due to cyclic mechanical strain

Author

Ryan, David T. ; Li, Liang ; Huang, Xianrui ; Bray, J.W. ; Laskaris, Evangelos T. ; Sivasubramaniam, Kiruba ; Gadre, Aniruddha D. ; Fogarty, James M. ; Harley, E.J. ; Otto, A. ; den Ouden, A.

Author_Institution

Gen. Electr. Global Res. Center, Niskayuna, NY, USA

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

3684

Lastpage

3687

Abstract

HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5% and cycle numbers up to and beyond 10⁴.

Keywords

bismuth compounds; calcium compounds; critical currents; high-temperature superconductors; stress effects; strontium compounds; BiSrCaCuO; HTS wires; centripetal force; critical current degradation; cyclic mechanical strain; electric devices; electromagnetic force; tensile strain; thermal force; Capacitive sensors; Critical current; High temperature superconductors; Magnetic field induced strain; Magnets; Rotating machines; Strain measurement; Tensile strain; Thermal degradation; Wires; Critical current degradation; HTS wires; cyclic strains; electric devices;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.849392

Filename

1440471