DocumentCode :
844071
Title :
High frequency scattering by a double impedance wedge
Author :
Herman, Martin I. ; Volakis, John L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
36
Issue :
5
fYear :
1988
fDate :
5/1/1988 12:00:00 AM
Firstpage :
664
Lastpage :
678
Abstract :
High-frequency diffraction coefficients are presented for up to and including the third-order interaction mechanisms associated with impedance double-wedge structures. The employed formulation is based on the extended spectral ray method (ESRM) accounting for all surface-wave contributions in a rigorous manner. Key identities are provided to enable an efficient asymptotic evaluation of the resulting integrals via a modified Paul-Clemmow steepest-descent method. The double-wedge structures considered are composed of a common face and outer faces which do not intersect. Examples of the structures studied are the thick impedance half-plane and the impedance insert in a full plane. Computations of the diffracted fields are also presented and found to be in good agreement with corresponding data generated with alternate methods. Some backscatter and bistatic patterns are presented for the purpose of examining the variation of the scattered fields as a function of the wedge angle and impedance
Keywords :
backscatter; electromagnetic fields; electromagnetic wave diffraction; electromagnetic wave scattering; Paul-Clemmow steepest-descent method; asymptotic evaluation; backscatter patterns; bistatic patterns; common face; diffracted fields; double impedance wedge; extended spectral ray method; high frequency diffraction coefficient; high frequency scattering; impedance; outer faces; scattered fields; thick impedance half-plane; third-order interaction mechanisms; wedge angle; Aircraft propulsion; Frequency; Geometry; Helium; Laboratories; Physical theory of diffraction; Scattering; Surface impedance; Surface waves;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.192144
Filename :
192144
Link To Document :
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