Title :
High coercivity and small grains of (Fe57Pt43)100-xCux ternary thin films
Author :
Park, K.M. ; Na, K.H. ; Na, J.G. ; Jang, P.W. ; Kim, H.J. ; Lee, S.R.
Author_Institution :
Thin Film Technol. Res. Center, Korea Inst. of Sci. & Technol., Seoul, South Korea
fDate :
9/1/2002 12:00:00 AM
Abstract :
(Fe57Pt43)100-xCux ternary films with x=0-4 at.% were prepared on Corning 7059 glass by dc magnetron sputtering in order to investigate the effect of Cu addition on the transformation rate of FePt alloy films. Structural and chemical analysis revealed that Cu was very effective in promoting the transformation to the L10 ordered phase and in suppressing grain growth of the L10 ordered phase when films were annealed at 400°C-700°C in vacuum. During the annealing, Cu atoms diffused onto the film surface, probably yielding many defects that remained inside the film. This Cu diffusion may be the reason for the rapid transformation.
Keywords :
alloying additions; annealing; coercive force; copper alloys; ferromagnetic materials; grain size; iron alloys; magnetic recording; magnetic thin films; order-disorder transformations; platinum alloys; sputtered coatings; surface diffusion; (Fe57Pt43)100-xCux; (Fe57Pt43)100-xCux ternary thin films; 400 to 700 degC; Corning 7059 glass; Cu addition; Cu atom surface diffusion; L10 ordered phase; chemical analysis; dc magnetron sputtering; grain growth suppression; high coercivity; order-disorder transformation; small grains; structural analysis; transformation rate; vacuum annealing; Annealing; Coercive force; Iron; Magnetic anisotropy; Magnetic films; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Sputtering; Temperature; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.802788