Title :
Effects of very thin carbon seedlayer on formation of hcp phase for CoCrPtB/Co60Cr40 perpendicular magnetic recording media
Author :
Saito, Shin ; Hoshi, Fumikazu ; Takahashi, Migaku
Author_Institution :
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
fDate :
9/1/2002 12:00:00 AM
Abstract :
This paper reports on a significant improvement of magnetic properties for CoCrPtB/Co60Cr40 perpendicular recording media by utilizing a very thin C seedlayer even with a thickness of less than 1 nm. This is caused by the following microstructural characteristics: 1) the C seedlayer, heated to above 200°C, reacts with the CoCr intermediate layer, resulting in the formation of a nanocrystalline layer with a thickness of about 6 nm; 2) Cr-deprived hcp grains with Cr segregation structure grow on the nanocrystalline layer without forming σ-phase grains in the intermediate layer; 3) CoCrPtB magnetic layers grow epitaxially on the intermediate layer without forming an initial layer, which behaves as a soft ferromagnetic layer and degrades magnetic properties of the media.
Keywords :
boron alloys; chromium alloys; cobalt alloys; ferromagnetic materials; magnetic epitaxial layers; magnetic thin films; magnetisation; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum alloys; segregation; sputter deposition; 1 nm; 200 degC; 6 nm; C; CoCr intermediate layer; CoCrPtB-Co60Cr40; CoCrPtB/Co60Cr40 perpendicular magnetic recording media; Cr segregation structure; Cr-deprived hcp grains; dc magnetron sputtering; epitaxial growth; hcp phase formation; magnetic properties; magnetic property degradation; magnetization curve; microstructural characteristics; nanocrystalline layer formation; perpendicular magnetic anisotropy analysis; saturation magnetization; soft ferromagnetic layer; very thin C seedlayer; Amorphous magnetic materials; Chromium; Magnetic anisotropy; Magnetic properties; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Saturation magnetization; Sputtering; Temperature; X-ray scattering;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.801795