DocumentCode :
845016
Title :
Damage mechanics of electronics on metal-backed substrates in harsh environments
Author :
Lall, P. ; Islam, Md Nurul ; Evans, J. ; Suhling, J.C. ; Shete, T.
Author_Institution :
Dept. of Mech. Eng., Auburn Univ., AL, USA
Volume :
29
Issue :
1
fYear :
2006
fDate :
3/1/2006 12:00:00 AM
Firstpage :
204
Lastpage :
212
Abstract :
Increased use of sensors and controls in automotive applications has resulted in significant emphasis on the deployment of electronics directly mounted on the engine and transmission. Increased shock, vibration, and higher temperatures necessitate the fundamental understanding of damage mechanisms which will be active in these environments. Electronics typical of office benign environments use FR-4 printed circuit boards (PCBs). Automotive applications typically use high glass-transition temperature laminates such as FR4-06 glass/epoxy laminate material (T/sub g/=164.9/spl deg/C). In automotive underhood application environments, metal-backing of PCBs is being targeted for thermal dissipation, mechanical stability, and interconnections reliability. In this study, the effect of metal-backed boards on the interconnect reliability has been evaluated. Previous studies on electronic reliability for automotive environments have addressed the damage mechanics of solder joints in plastic ball-grid arrays (BGAs) on nonmetal backed substrates and ceramic BGAs on nonmetal backed substrates. Other failure mechanisms investigated include delamination of PCB from metal backing. The test vehicle is a metal backed FR4-06 laminate. Metal backings investigated include aluminum and beryllium copper. Three adhesives have been investigated for metal backing including arlon, pressure sensitive adhesive, and pre-preg. The use of conformal coating for reliability improvement has also been investigated. Component architectures tested include plastic BGA devices, C2BGA devices, quad flat no-lead (QFN), and discrete resistors. Reliability of the component architectures has been evaluated for hot air solder level and electroless Ni/Au finishes. Crack propagation and intermetallic thickness data has been acquired as a function of cycle count. Reliability data has been acquired on all these architectures. Material constitutive behavior of arlon and pressure sensitive adhesive has been measured - sing uni-axial test samples. The measured material constitutive behavior has been incorporated into nonlinear finite element simulations. Predictive models have been developed for the dominant failure mechanisms for all the component architectures tested.
Keywords :
adhesives; aluminium alloys; automotive electronics; ball grid arrays; beryllium alloys; ceramic packaging; crack detection; delamination; finite element analysis; plastic packaging; printed circuits; reliability; solders; 164.9 C; Al; BeCu; C2BGA devices; NiAu; automotive electronics; ceramic BGA; conformal coating; crack propagation; delamination; discrete resistors; electronic reliability; electronics damage mechanics; failure mechanisms; glass-transition temperature laminates; hot air solder level; interconnection reliability; intermetallic thickness data; mechanical stability; metal backings; metal-backed board effect; metal-backed substrates; nonlinear finite element simulation; nonmetal backed substrates; plastic BGA devices; plastic ball-grid arrays; pressure sensitive adhesive; printed circuit boards; quad flat no-lead resistors; solder joints; thermal dissipation; uni-axial test; Automotive applications; Automotive engineering; Component architectures; Electric shock; Engines; Failure analysis; Integrated circuit interconnections; Laminates; Plastics; Testing; Metal-back; reliability; solder joint;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2006.870390
Filename :
1599512
Link To Document :
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