• DocumentCode
    845337
  • Title

    90-nm process-variation adaptive embedded SRAM modules with power-line-floating write technique

  • Author

    Yamaoka, Masanao ; Maeda, Noriaki ; Shinozaki, Yoshihiro ; Shimazaki, Yasuhisa ; Nii, Koji ; Shimada, Shigeru ; Yanagisawa, Kazumasa ; Kawahara, Takayuki

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    41
  • Issue
    3
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    705
  • Lastpage
    711
  • Abstract
    The power consumption of a low-power system-on-a-chip (SoC) has a large impact on the battery life of mobile appliances. General SoCs have large on-chip SRAMs, which consume a large proportion of the whole LSI power. To achieve a low-power SoC, we have developed embedded SRAM modules, which use some low-power SRAM techniques. One technique involves expanding the write margin; another is a power-line-floating write technique, which enables low-voltage write operation. The power-line-floating write technique makes it possible to lower the minimum operating supply voltage by 100 mV. The other techniques involve using a process-variation-adaptive write replica circuit and reducing leakage current. These techniques reduce active power during write operations by 18% and reduce active leakage of the word-line driver by 64%. The prototype SRAM modules achieve 0.8-V operation, and a 512-kb SRAM module achieves 48.4-μA active leakage and 7.8-μA standby leakage with worst-leakage devices.
  • Keywords
    leakage currents; low-power electronics; random-access storage; system-on-chip; 0.8 V; 100 mV; 48.4 muA; 512 kbit; 7.8 muA; 90 nm; leakage current; low-voltage write operation; power-line-floating write technique; process-variation adaptive embedded SRAM modules; process-variation-adaptive write replica circuit; system-on-a-chip; write margin; Batteries; Driver circuits; Energy consumption; Home appliances; Large scale integration; Leakage current; Prototypes; Random access memory; System-on-a-chip; Voltage; Low leakage; SRAM; low-voltage operation; write margin;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.869786
  • Filename
    1599539