• DocumentCode
    845353
  • Title

    Determination of the time-dependence of ΩNBS using the quantized Hall resistance

  • Author

    Cage, Marvin E. ; Dziuba, Ronald F. ; Van Degrift, Craig T. ; Yu, Dingy

  • Author_Institution
    NBS, Gaithersburg, MD, USA
  • Volume
    38
  • Issue
    2
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    263
  • Lastpage
    269
  • Abstract
    The quantum Hall effect is being used to monitor the US legal representation of the ohm, or as-maintained ohm, ΩNBS. Measurements have been made on a regular basis since August 1983. Individual transfers between the quantized Hall resistance R H and the five 1-Ω resistors which comprise ΩNBS can be made with a total of one standard deviation (1σ) uncertainty of ±0.014 p.p.m. This uncertainty is the root-sum-square of 32 individual components. The time-dependent expression for RH in terms of ΩNBS is: RH=25812.8[1+(1.842±0.012)×10-6 =(0.0529±0.0040)(t-0.7785)×10-6 /year] ΩNBS, where t is measured in years from January 1, 1987. The value of ΩNBS is, therefore, decreasing at the rate of (0.0529±0.0040) p.p.m./year
  • Keywords
    electric resistance measurement; quantum Hall effect; units (measurement); US; measurement units; ohm; quantized Hall resistance; quantum Hall effect; resistors; time-dependence; Contacts; Electrical resistance measurement; Electrons; Gallium arsenide; Hall effect; Law; Legal factors; NIST; Probes; Resistors;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.192285
  • Filename
    192285