DocumentCode
845353
Title
Determination of the time-dependence of ΩNBS using the quantized Hall resistance
Author
Cage, Marvin E. ; Dziuba, Ronald F. ; Van Degrift, Craig T. ; Yu, Dingy
Author_Institution
NBS, Gaithersburg, MD, USA
Volume
38
Issue
2
fYear
1989
fDate
4/1/1989 12:00:00 AM
Firstpage
263
Lastpage
269
Abstract
The quantum Hall effect is being used to monitor the US legal representation of the ohm, or as-maintained ohm, ΩNBS. Measurements have been made on a regular basis since August 1983. Individual transfers between the quantized Hall resistance R H and the five 1-Ω resistors which comprise ΩNBS can be made with a total of one standard deviation (1σ) uncertainty of ±0.014 p.p.m. This uncertainty is the root-sum-square of 32 individual components. The time-dependent expression for R H in terms of ΩNBS is: R H=25812.8[1+(1.842±0.012)×10-6 =(0.0529±0.0040)(t -0.7785)×10-6 /year] ΩNBS, where t is measured in years from January 1, 1987. The value of ΩNBS is, therefore, decreasing at the rate of (0.0529±0.0040) p.p.m./year
Keywords
electric resistance measurement; quantum Hall effect; units (measurement); US; measurement units; ohm; quantized Hall resistance; quantum Hall effect; resistors; time-dependence; Contacts; Electrical resistance measurement; Electrons; Gallium arsenide; Hall effect; Law; Legal factors; NIST; Probes; Resistors;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.192285
Filename
192285
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