• DocumentCode
    845797
  • Title

    Sensitivity of the dual-carrier scheme for the contact-free detection of current noise

  • Author

    Hasiguchi, Sumihisa

  • Author_Institution
    Dept. of Electron., Yamanashi Univ., Kofu, Japan
  • Volume
    38
  • Issue
    2
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    434
  • Lastpage
    437
  • Abstract
    A configuration for the detection of current noise is proposed. in which no electrical contacts to the sample under measurement are necessary. The threshold sensitivity of the detection of the current fluctuation can be considerably improved by applying the correlation technique to obtain the spectrum of the fluctuations to be measured. It was demonstrated that a relative conductance fluctuation as low as 10 -6 is detectable with the proposed configuration. The most significant limiting factor to the sensitivity is the fluctuation of the ambient temperature, which must be suppressed to a level less than 0.1 K-rms/1 Hz at 1 Hz
  • Keywords
    correlation methods; electric admittance measurement; electric noise measurement; ambient temperature; contact-free detection; correlation; current fluctuation; current noise; dual-carrier scheme; threshold sensitivity; Coils; Conductivity measurement; Contacts; Current measurement; Electric variables measurement; Fluctuations; Magnetic flux; Noise measurement; Rectifiers; Semiconductor device noise;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.192321
  • Filename
    192321