DocumentCode :
845797
Title :
Sensitivity of the dual-carrier scheme for the contact-free detection of current noise
Author :
Hasiguchi, Sumihisa
Author_Institution :
Dept. of Electron., Yamanashi Univ., Kofu, Japan
Volume :
38
Issue :
2
fYear :
1989
fDate :
4/1/1989 12:00:00 AM
Firstpage :
434
Lastpage :
437
Abstract :
A configuration for the detection of current noise is proposed. in which no electrical contacts to the sample under measurement are necessary. The threshold sensitivity of the detection of the current fluctuation can be considerably improved by applying the correlation technique to obtain the spectrum of the fluctuations to be measured. It was demonstrated that a relative conductance fluctuation as low as 10 -6 is detectable with the proposed configuration. The most significant limiting factor to the sensitivity is the fluctuation of the ambient temperature, which must be suppressed to a level less than 0.1 K-rms/1 Hz at 1 Hz
Keywords :
correlation methods; electric admittance measurement; electric noise measurement; ambient temperature; contact-free detection; correlation; current fluctuation; current noise; dual-carrier scheme; threshold sensitivity; Coils; Conductivity measurement; Contacts; Current measurement; Electric variables measurement; Fluctuations; Magnetic flux; Noise measurement; Rectifiers; Semiconductor device noise;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.192321
Filename :
192321
Link To Document :
بازگشت