Wide-band characterization of multilayer thick film structures using a time-domain technique

Author

Toscano, Juan Carlos ; Elshabini-Riad, A. ; Riad, Sedki M. ; Al-Mazroo, A.Y.

Author_Institution

Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA

Volume

38

Issue

2

fYear

1989

fDate

4/1/1989 12:00:00 AM

Firstpage

515

Lastpage

520

Abstract

A technique for modeling multilayer thick-film structures using time-domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layers, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a time-domain reflectometry (TDR) waveform is acquired. This TDR waveform is used to develop an equivalent network for the multilayer thick-film structure. The equivalent network model is then analyzed using conventional circuit analysis techniques to characterize the various electrical parameters (or properties) of the structure

Keywords

circuit analysis computing; equivalent circuits; inductors; thick film devices; time-domain analysis; time-domain reflectometry; waveform analysis; circuit analysis; dielectric layers; equivalent network; iterative method; multilayer inductor; multilayer thick film structures; reference line; spiral coils; time-domain measurements; time-domain reflectometry; waveform; wideband characterisation; Circuit analysis; Dielectric measurements; Nonhomogeneous media; Spirals; Stacking; Thick film inductors; Thick films; Thickness measurement; Time domain analysis; Wideband;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.192337

Filename

192337