DocumentCode
846732
Title
Optimal diagnostic methods for wiring interconnects
Author
Cheng, Wu-Tung ; Lewandowski, James L. ; Wu, Eleanor
Author_Institution
AT&T Bell Lab., Princeton, NJ, USA
Volume
11
Issue
9
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
1161
Lastpage
1166
Abstract
The problem of generating minimum test sets for diagnosing faults in wiring interconnects on printed circuit boards is addressed. It is assumed that all the nets can be accessed in parallel or through a boundary-scan chain on the board. The fault model includes multiple stuck-at-hand faults. Three methods for three different diagnosis mechanisms are presented. All the diagnostic methods can be further improved by taking advantage of the structural information of wiring interconnects
Keywords
boundary scan testing; fault location; printed circuit testing; wiring; boundary-scan chain; diagnosis mechanisms; faults; minimum test sets; multiple stuck-at-hand faults; printed circuit boards; structural information; wiring interconnects; Circuit faults; Circuit testing; Design automation; Electrical fault detection; Fault detection; Helium; Integrated circuit interconnections; Printed circuits; Routing; Wiring;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.160002
Filename
160002
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