• DocumentCode
    847026
  • Title

    Electron and Hole Current Characteristics of n-i-p-Type Semiconductor Quantum Dot Transistor

  • Author

    Fujihashi, Chugo ; Yukiya, Tokio ; Asenov, Asen

  • Author_Institution
    Dept. of Appl. Comput. Sci., Tokyo Polytech. Univ., Atsugi
  • Volume
    6
  • Issue
    3
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    320
  • Lastpage
    327
  • Abstract
    For the future development of semiconductor quantum dot transistors, a novel n-i-p-type semiconductor quantum dot transistor consisting of an n-type source, an i-type dot, and a p-type drain is presented in this paper. The explicit steady-state solution to a set of an infinite number of stochastic theoretical probability equations is given. The solution is applicable to both metal and semiconductor quantum dot transistors. The electron and hole current characteristics controlled by means of the gate voltage are computed numerically, and it is pointed out that the electron or hole current state can be selected by applying a positive or negative gate voltage
  • Keywords
    semiconductor device models; semiconductor quantum dots; stochastic processes; transistors; electron current characteristics; explicit steady-state solution; gate voltage; hole current characteristics; i-type dot; n-i-p-type semiconductor quantum dot transistor; n-type source; p-type drain; stochastic theoretical probability equations; Charge carrier processes; Contact resistance; Equations; Integrated circuit technology; Quantum dots; Quantum mechanics; Steady-state; Stochastic processes; Transistors; Tunneling; Electron and hole current; n-i-p type; quantum dot transistor; stochastic theoretical solution;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2007.893570
  • Filename
    4200728