Concepts in system testing of dielectrics in capacitors

This paper deals with system testing of dielectrics and their relation to power-factor-correction capacitors. The interaction of the various components in an electrical system are complex and extremely difficult to evaluate using ordinary analytical techniques. The major problems associated with analytical methods are overcome by using the systems approach. Evaluations which have been conducted with systems have yielded design information, processing data, and reliability characteristics which have previously been unobtainable even with large capacitors.