DocumentCode
847690
Title
Characteristics of integrated QWIP-HBT-LED up-converter
Author
Oktyabrsky, Serge ; Khmyrova, Irina ; Ryzhii, Victor
Author_Institution
Sch. of NanoSciences & NanoEngineering, State Univ. of New York, Albany, NY, USA
Volume
50
Issue
12
fYear
2003
Firstpage
2378
Lastpage
2387
Abstract
In this paper, we evaluate characteristics of a novel device based on the integration of a quantum well IR photodetector (QWIP), a heterostructure bipolar transistor (HBT), and a light-emitting diode (LED) for up-conversion of middle infrared (IR) into near IR (visible) radiation. Its operation is associated with intersubband absorption of middle IR radiation in the QWIP, amplification of the QWIP output electric signal in the HBT, and emission of near IR or visible radiation from the LED fed by the current injected from the HBT. This device allows us to use Si sensors for IR and thermal imaging and significantly surpass the one based on integration of a QWIP and a LED. If the HBT current gain is high enough, the total noise of the IR camera with the up-converter can be comparable to that of the QWIP electrically connected to a read-out circuit. The major sources of the excess noise are shot noise and 1/f noise of the HBT and shot noise of the charge coupled device (CCD) sensor. The criteria to reduce their influence are established. The QWIP-HBT-LED up-converter becomes most advantageous for megapixel focal plane arrays and high read-out rate cameras.
Keywords
1/f noise; CCD image sensors; equivalent circuits; focal planes; heterojunction bipolar transistors; infrared detectors; integrated circuit noise; integrated optoelectronics; light emitting diodes; photodetectors; quantum well devices; readout electronics; semiconductor device noise; shot noise; 1/f noise; Boltzmann constant; CCD sensor; IR camera; IR imaging; equivalent circuit diagram; heterostructure bipolar transistor; high readout rate cameras; integrated QWIP-HBT-LED upconverter; intersubband absorption; light-emitting diode; megapixel focal plane arrays; quantum conversion efficiency; quantum well IR photodetector; readout integrated circuit; shot noise; thermal imaging; total noise; Bipolar transistors; Cameras; Circuit noise; Electromagnetic wave absorption; Heterojunction bipolar transistors; Image sensors; Infrared image sensors; Light emitting diodes; Photodetectors; Thermal sensors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2003.819249
Filename
1255599
Link To Document