• DocumentCode
    847958
  • Title

    Magnetic and mechanical properties of Ni-Mn-Ga single crystals

  • Author

    Pasquale, Massimo ; Sasso, Carlo P. ; Besseghini, Stefano ; Villa, Elena ; Lograsso, Thomas A. ; Schlagel, Deborah L.

  • Author_Institution
    Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    2847
  • Lastpage
    2849
  • Abstract
    A method is presented to obtain large field-induced strain in NiMnGa-oriented single crystals. The magneto-mechanical results here presented are measured on an oriented single crystal of composition Ni50Mn29.5Ga20.5 with {100} and {110} faces. The method relies on the stress-strain characterization of the sample. Once a repeatable pseudoplastic behavior is obtained by a sequence of mechanical cycles and thermal treatments, a combination of stress and magnetic field is applied, achieving a 1.2% irreversible strain by applying a 450 kA/m magnetic field along the [100] direction and maintaining a [100] stress value to about 12.5 MPa.
  • Keywords
    ferromagnetic materials; gallium alloys; magnetomechanical effects; manganese alloys; nickel alloys; plasticity; shape memory effects; stress-strain relations; thermomechanical treatment; Ni-Mn-Ga; Ni-Mn-Ga single crystals; Ni50Mn29.5Ga20.5; NiMnGa-oriented single crystals; [100] direction; [100] stress value; composition; irreversible strain; large field-induced strain; magnetic field; magnetic properties; magneto-mechanical results; mechanical cycles; mechanical properties; oriented single crystal; repeatable pseudoplastic behavior; shape memory ferromagnetic alloys; stress; stress-strain characterization; thermal treatments; {100} faces; {110} faces; Crystals; Magnetic field induced strain; Magnetic field measurement; Magnetic materials; Magnetostriction; Mechanical factors; Shape memory alloys; Stress measurement; Temperature; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.802477
  • Filename
    1042382