Title :
Step-edge magnetoresistance of magnetite films
Author :
Ziese, M. ; Höhne, R. ; Zimmer, K. ; Esquinazi, P.
Author_Institution :
Dept. of Supercond. & Magnetism, Leipzig Univ., Germany
fDate :
9/1/2002 12:00:00 AM
Abstract :
The magnetoresistance induced by step edges in magnetite films was investigated. The films were fabricated on MgAl2O4 substrates patterned by ion-beam etching prior to film deposition. If the crystallographic quality of the magnetite film is good enough, a clear magnetoresistance anisotropy is observed with respect to the relative direction of current and step edge.
Keywords :
ferrimagnetic materials; iron compounds; magnetic thin films; magnetoresistance; pulsed laser deposition; tunnelling; Fe3O4; MgAl2O4; Verwey temperature; anisotropic magnetoresistance; crystallographic quality; current-voltage characteristics; extended defects; ferrimagnet; field-dependent magnetoresistance; ion-beam patterned substrates; magnetite films; magnetoresistance anisotropy; magnetotransport properties; pulsed-laser deposition; relative direction; step-edge magnetoresistance; tunneling; Etching; Grain boundaries; Iron; Magnetic anisotropy; Magnetoresistance; Perpendicular magnetic anisotropy; Substrates; Superconducting films; Superconducting magnets; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.803166