• DocumentCode
    848504
  • Title

    Validity of I2T extrapolation of damaging fault currents in metering devices

  • Author

    Milligan, J.W.

  • Author_Institution
    Duncan Electric Company, Inc., Lafayette, Indiana
  • Volume
    94
  • Issue
    3
  • fYear
    1975
  • fDate
    5/1/1975 12:00:00 AM
  • Firstpage
    977
  • Lastpage
    982
  • Abstract
    The use of I2T to extrapolate data points of watthour meter destructive failure tests over a wide range of fault durations is questioned. Data from an experiment using special test fixtures designed for ease of calculation of the electromechanical forces associated with fault currents is discussed for faults to failure having different current magnitudes and durations. High-current-short-duration faults required significantly lower I2T levels to produce a given failure mode than did low-current-long-duration faults. Several failure modes are defined. Confirming tests were made with modern single-phase watt-hour meters.
  • Keywords
    Circuit faults; Extrapolation; Fault currents; Fuses; Impedance; Sockets; Testing; Transformers; Watthour meters; Wire;
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9510
  • Type

    jour

  • DOI
    10.1109/T-PAS.1975.31931
  • Filename
    1601533