DocumentCode
848504
Title
Validity of I2T extrapolation of damaging fault currents in metering devices
Author
Milligan, J.W.
Author_Institution
Duncan Electric Company, Inc., Lafayette, Indiana
Volume
94
Issue
3
fYear
1975
fDate
5/1/1975 12:00:00 AM
Firstpage
977
Lastpage
982
Abstract
The use of I2T to extrapolate data points of watthour meter destructive failure tests over a wide range of fault durations is questioned. Data from an experiment using special test fixtures designed for ease of calculation of the electromechanical forces associated with fault currents is discussed for faults to failure having different current magnitudes and durations. High-current-short-duration faults required significantly lower I2T levels to produce a given failure mode than did low-current-long-duration faults. Several failure modes are defined. Confirming tests were made with modern single-phase watt-hour meters.
Keywords
Circuit faults; Extrapolation; Fault currents; Fuses; Impedance; Sockets; Testing; Transformers; Watthour meters; Wire;
fLanguage
English
Journal_Title
Power Apparatus and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9510
Type
jour
DOI
10.1109/T-PAS.1975.31931
Filename
1601533
Link To Document