DocumentCode

849303

Title

Noise measurements in field-effect transistors

Author

Bruncke, W.C.

Volume

51

Issue

2

fYear

1963

Firstpage

378

Lastpage

379

Keywords

Capacitance; Circuits; Diodes; FETs; Frequency; Impedance; Noise measurement; Radiofrequency amplifiers; Transconductance; Voltage;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1963.1795

Filename

1443725