• DocumentCode
    850176
  • Title

    VAMAS critical current round robin test on a 2212 BSCCO Ag-sheathed tape

  • Author

    Itoh, K. ; Murakami, Y. ; Yuyama, M. ; Wada, H.

  • Author_Institution
    Nat. Res. Inst. for Metals, Ibaraki, Japan
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    544
  • Lastpage
    547
  • Abstract
    Aiming at the establishment of a reliable critical current, I/sub c/, a measurement method for oxide superconductors, a round robin test (RRT) has been implemented in Japan in the framework of VAMAS (Versailles Project on Advanced Materials and Standards), using a 2212 BSCCO Ag-sheathed tape conductor. In this RRT each participant received two pre-instrumented and pre-measured specimens and one freestanding specimen. Measurements were made at 4.2 K and magnetic fields ranging from 0 to 10 T. One of the pre-instrumented specimens was also routed among participants as a RRT specimen. Together with the RRT specimen, a superconductor I-V simulator was circulated to intercompare the I-V measurement set-ups used at participant labs. Measurements on pre-instrumented specimens have shown that I/sub c/ of Ag-sheathed tapes is sensitive to the heat cycle, which may be attributed to the deformation of the oxide superconductor by swelling and/or to the formation of cracks inside the oxide layer.<>
  • Keywords
    bismuth compounds; cracks; critical current density (superconductivity); electric current measurement; strontium compounds; superconducting tapes; 0 to 10 T; 2212 BSCCO Ag-sheathed tape; 4.2 K; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O-Ag; I-V measurement set-ups; Japan; VAMAS critical current round robin test; Versailles Project on Advanced Materials and Standards; cracks; freestanding specimen; heat cycle; magnetic fields; oxide layer; oxide superconductors; pre-instrumented specimens; pre-measured specimens; superconductor I-V simulator; swelling; Bismuth compounds; Conducting materials; Critical current; Current measurement; Magnetic field measurement; Materials reliability; Particle measurements; Round robin; Superconductivity; Testing;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402608
  • Filename
    402608