DocumentCode
850187
Title
USA interlaboratory comparison of superconductor simulator critical current measurements
Author
Goodrich, L.F. ; Wiejaczka, J.A. ; Srivastara, A.N. ; Stauffer, T.C. ; Medina, L.T.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume
5
Issue
2
fYear
1995
fDate
6/1/1995 12:00:00 AM
Firstpage
548
Lastpage
551
Abstract
An interlaboratory comparison of critical current (I/sub c/) measurements was conducted on the superconductor simulator, which is an electronic circuit that emulates the extremely nonlinear voltage-current characteristic of a superconductor. These simulators are high precision instruments, and are useful for establishing the integrity of part of a superconductor measurement system. This study includes measurements from participating US laboratories, with NIST as the central, organizing laboratory. This effort was designed to determine the sources of uncertainty in I/sub c/ measurements due to uncertainties in the measurement apparatus, technique, or the analysis system. The participating laboratories measured the superconductor simulator with a variety of methods including DC and pulse. This comparison indicated the presence of systematic biases and higher variability at low voltages in the I/sub c/ determinations of the measurement systems. All critical current measurements at a criterion of 10 /spl mu/V on the I/sub c/ simulator were within 2% of the NIST value for nominal critical currents of 2 and 50 A. These results could significantly benefit superconductor measurement applications that require high-precision quality assurance.<>
Keywords
critical currents; electric current measurement; laboratories; simulation; superconducting materials; 2 to 50 A; USA interlaboratory comparison; critical current measurements; electronic circuit; high precision instruments; high-precision quality assurance; measurement apparatus; nonlinear voltage-current characteristic emulation; superconductor simulator; Circuit simulation; Critical current; Current measurement; Electronic circuits; Laboratories; Measurement uncertainty; NIST; Particle measurements; Pulse measurements; Voltage;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.402609
Filename
402609
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