• DocumentCode
    850207
  • Title

    Characterizing the S/N transition of VAMAS HTS samples

  • Author

    Weijers, H.W. ; van Sciver, S.W.

  • Author_Institution
    Nat. High Magnetic Field Lab., Florida State Univ., Tallahassee, FL, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    556
  • Lastpage
    559
  • Abstract
    As a part of a VAMAS program, the S/N transition of short sample HTS conductors were studied for a range of fields and temperatures. This paper discusses the characterization of typical and damaged samples at 4.2 K and 0 T. Attention is given to the calculation of n-values and the first derivative of the V-I curves. Also, the measurement setup is explained in some detail.<>
  • Keywords
    electric current measurement; high-temperature superconductors; power cable testing; power cables; superconducting cables; voltage measurement; HTS conductors; S/N transition; V-I curves; VAMAS program; characterization; first derivatives; magnetic fields; measurements; n-values; temperatures; Conductors; Critical current; Current measurement; High temperature superconductors; Laboratories; Magnetic field measurement; Magnetic fields; Niobium compounds; Titanium compounds; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402611
  • Filename
    402611