• DocumentCode
    850585
  • Title

    Empirical parameter variation analysis for electronic circuits

  • Author

    Klapp, S.

  • Author_Institution
    Batelle Memorial Institute, Columbus, Ohio
  • Volume
    51
  • Issue
    3
  • fYear
    1963
  • fDate
    3/1/1963 12:00:00 AM
  • Firstpage
    508
  • Lastpage
    508
  • Abstract
    Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
  • Keywords
    Circuit analysis; Circuit optimization; Circuit simulation; Circuit synthesis; Electronic circuits; Measurement; Performance analysis;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1963.1918
  • Filename
    1443848
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=850585