• DocumentCode
    850995
  • Title

    Characteristics of Edge Breakdowns on Teflon Samples

  • Author

    Yadlowsky, E.J. ; Hazelton, R.C. ; Churchill, R.J.

  • Author_Institution
    Research and Development Center Inland Motor Divisions, Kollmorgen Corporation 801 First Street Radford, Virginia 24141
  • Volume
    27
  • Issue
    6
  • fYear
    1980
  • Firstpage
    1765
  • Lastpage
    1769
  • Abstract
    Geosynchronous satellites have been observed to exhibit anomalous behavior attributable to electrical discharges resulting from differential charging of satellite surfaces by energetic electrons. A program has been undertaken to study the characteristics of electrical discharges induced on silverbacked Teflon samples irradiated by a monoenergetic beam of electrons under carefully controlled laboratory conditions. Measurements of breakdown threshold voltages, particle emission and material damage have been made for Teflon samples (75 and 125¿m thick) with selected edges exposed to the electron beam. Measurements indicate a strong dependence of threshold voltage upon the choice of sample edge that is exposed. The Teflon samples exhibit a difference of ~10kV in breakdown threshold voltage depending on the sample orientation. Optical birefringence indicative of long range alignment of the bulk material has been observed along axes which correspond to the axes that define the orientation for maximum and minimum threshold voltages. This result can be significant to spacecraft designers because optical prescreening of Teflon samples may allow optimal choice of material orientation upon the spacecraft to minimize the deleterious effect of dielectric discharges.
  • Keywords
    Aircraft manufacture; Breakdown voltage; Electric breakdown; Electron beams; Laboratories; Optical materials; Satellites; Surface charging; Surface discharges; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1980.4331103
  • Filename
    4331103